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图片 制造商型号 库存情况 价格 库存 数据手册 系列 封装/外壳 包装 产品状态 逻辑类型 电源电压 位数 工作温度 等级 认证 安装类型 供应商设备封装
SNJ54ABT8245FK

SNJ54ABT8245FK

SCAN TEST DEVICES WITH OCTAL BUS

Texas Instruments

4,499 -
SNJ54ABT8245FK

数据手册

54ABT 28-CLCC Tube Active Scan Test Device with Bus Transceivers 4.5V ~ 5.5V 8 -55°C ~ 125°C - - Surface Mount 28-LCCC (11.43x11.43)
SN74S1052NS

SN74S1052NS

DIODE ARRAY SCHOTT 7V 50MA 20SO

Texas Instruments

4,641 1.14

-

74S 20-SOIC (0.209", 5.30mm Width) Tube Active Schottky Barrier Diode Bus-Termination Array - 16 0°C ~ 70°C - - Surface Mount 20-SO
JM38510/07802BEA

JM38510/07802BEA

LOOK-AHEAD CARRY GENERATORS 16-C

Texas Instruments

4,710 -
JM38510/07802BEA

数据手册

54S 16-CDIP (0.300", 7.62mm) Tube Active Look-ahead Carry Generator 4.5V ~ 5.5V 4 -55°C ~ 125°C - - Through Hole 16-CDIP
SNJ54BCT8244AFK

SNJ54BCT8244AFK

SCAN TEST DEVICES WITH OCTAL BUF

Texas Instruments

4,625 53.31
SNJ54BCT8244AFK

数据手册

54BCT 28-CLCC Tube Active Scan Test Device with Buffers 4.5V ~ 5.5V 8 -55°C ~ 125°C - - Surface Mount 28-LCCC (11.43x11.43)
CD54HC297F3A

CD54HC297F3A

HIGH SPEED CMOS LOGIC DIGITAL PH

Texas Instruments

3,998 -
CD54HC297F3A

数据手册

54HC 16-CDIP (0.300", 7.62mm) Tube Active Digital Phase-Locked-Loop Filters 2V ~ 6V 4 -55°C ~ 125°C - - Through Hole 16-CDIP
SNJ54ABT8652JT

SNJ54ABT8652JT

SCAN TEST DEVICES WITH OCTAL BUS

Texas Instruments

1,114 -

-

54ABT 28-CDIP (0.300", 7.62mm) Tube Active Scan Test Device with Bus Transceiver and Registers 4.5V ~ 5.5V 8 -55°C ~ 125°C - - Through Hole 28-CDIP
M38510/31202BEA

M38510/31202BEA

4-BIT BINARY FULL ADDERS WITH FA

Texas Instruments

4,577 -
M38510/31202BEA

数据手册

54LS 16-CDIP (0.300", 7.62mm) Tube Active Binary Full Adder with Fast Carry 4.5V ~ 5.5V 4 -55°C ~ 125°C - - Through Hole 16-CDIP
CD54ACT283F3A

CD54ACT283F3A

4-BIT BINARY FULL ADDER WITH FAS

Texas Instruments

2,545 -
CD54ACT283F3A

数据手册

54ACT 16-CDIP (0.300", 7.62mm) Tube Active Binary Full Adder with Fast Carry 4.5V ~ 5.5V 4 -55°C ~ 125°C - - Through Hole 16-CDIP
SNJ54BCT8245AFK

SNJ54BCT8245AFK

SCAN TEST DEVICES WITH OCTAL BUS

Texas Instruments

1,992 -
SNJ54BCT8245AFK

数据手册

54BCT 28-CLCC Tube Active Scan Test Device with Bus Transceivers 4.5V ~ 5.5V 8 -55°C ~ 125°C - - Surface Mount 28-LCCC (11.43x11.43)
SNJ54BCT8244AJT

SNJ54BCT8244AJT

SCAN TEST DEVICES WITH OCTAL BUF

Texas Instruments

1,324 -
SNJ54BCT8244AJT

数据手册

54BCT 24-CDIP (0.300", 7.62mm) Tube Active Scan Test Device with Buffers 4.5V ~ 5.5V 8 -55°C ~ 125°C - - Through Hole 24-CDIP