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图片 制造商型号 库存情况 价格 库存 数据手册 系列 封装/外壳 包装 产品状态 逻辑类型 电源电压 位数 工作温度 等级 认证 安装类型 供应商设备封装
SN74BCT8374ADWR

SN74BCT8374ADWR

IC SCAN TEST DEVICE W/FF 24-SOIC

Texas Instruments

1,862 -
SN74BCT8374ADWR

数据手册

74BCT 24-SOIC (0.295", 7.50mm Width) Tape & Reel (TR) Obsolete Scan Test Device with D-Type Edge-Triggered Flip-Flops 4.5V ~ 5.5V 8 0°C ~ 70°C - - Surface Mount 24-SOIC
SN74BCT8240ADWRG4

SN74BCT8240ADWRG4

IC SCAN TEST DEVICE 24SOIC

Texas Instruments

2,467 -
SN74BCT8240ADWRG4

数据手册

74BCT 24-SOIC (0.295", 7.50mm Width) Tape & Reel (TR) Obsolete Scan Test Device with Inverting Buffers 4.5V ~ 5.5V 8 0°C ~ 70°C - - Surface Mount 24-SOIC
SN74BCT8373ADWRG4

SN74BCT8373ADWRG4

IC SCAN TEST DEVICE 24SOIC

Texas Instruments

1,749 -
SN74BCT8373ADWRG4

数据手册

74BCT 24-SOIC (0.295", 7.50mm Width) Tape & Reel (TR) Obsolete Scan Test Device with D-Type Latches 4.5V ~ 5.5V 8 0°C ~ 70°C - - Surface Mount 24-SOIC
SN74BCT8374ADWRG4

SN74BCT8374ADWRG4

IC SCAN TEST DEVICE 24SOIC

Texas Instruments

4,346 -
SN74BCT8374ADWRG4

数据手册

74BCT 24-SOIC (0.295", 7.50mm Width) Tape & Reel (TR) Obsolete Scan Test Device with D-Type Edge-Triggered Flip-Flops 4.5V ~ 5.5V 8 0°C ~ 70°C - - Surface Mount 24-SOIC
SN74ABT8543DWR

SN74ABT8543DWR

IC SCAN TEST DEVICE 28-SOIC

Texas Instruments

3,484 -
SN74ABT8543DWR

数据手册

74ABT 28-SOIC (0.295", 7.50mm Width) Tape & Reel (TR) Obsolete Scan Test Device with Registered Bus Transceiver 4.5V ~ 5.5V 8 -40°C ~ 85°C - - Surface Mount 28-SOIC
SN74ABT8646DWR

SN74ABT8646DWR

IC SCAN TEST DEVICE 28-SOIC

Texas Instruments

3,382 -
SN74ABT8646DWR

数据手册

74ABT 28-SOIC (0.295", 7.50mm Width) Tape & Reel (TR) Obsolete Scan Test Device with Bus Transceiver and Registers 4.5V ~ 5.5V 8 -40°C ~ 85°C - - Surface Mount 28-SOIC
SN74ABT8652DLR

SN74ABT8652DLR

IC SCAN TEST DEVICE 28-SSOP

Texas Instruments

1,459 -
SN74ABT8652DLR

数据手册

74ABT 28-BSSOP (0.295", 7.50mm Width) Tape & Reel (TR) Obsolete Scan Test Device with Bus Transceiver and Registers 4.5V ~ 5.5V 8 -40°C ~ 85°C - - Surface Mount 28-BSSOP
SN74ABT8543DWRG4

SN74ABT8543DWRG4

IC SCAN TEST DEVICE 28SOIC

Texas Instruments

4,151 -
SN74ABT8543DWRG4

数据手册

74ABT 28-SOIC (0.295", 7.50mm Width) Tape & Reel (TR) Obsolete Scan Test Device with Registered Bus Transceiver 4.5V ~ 5.5V 8 -40°C ~ 85°C - - Surface Mount 28-SOIC
SN74ABT8646DWRG4

SN74ABT8646DWRG4

IC SCAN TEST DEVICE 28SOIC

Texas Instruments

3,376 -
SN74ABT8646DWRG4

数据手册

74ABT 28-SOIC (0.295", 7.50mm Width) Tape & Reel (TR) Obsolete Scan Test Device with Bus Transceiver and Registers 4.5V ~ 5.5V 8 -40°C ~ 85°C - - Surface Mount 28-SOIC
SN74ABT8652DWRG4

SN74ABT8652DWRG4

IC SCAN TEST DEVICE 28SOIC

Texas Instruments

3,426 -
SN74ABT8652DWRG4

数据手册

74ABT 28-SOIC (0.295", 7.50mm Width) Tape & Reel (TR) Obsolete Scan Test Device with Bus Transceiver and Registers 4.5V ~ 5.5V 8 -40°C ~ 85°C - - Surface Mount 28-SOIC
74F583PC

74F583PC

IC ADDER BCD 4BIT 16-DIP

onsemi

2,006 4.56
74F583PC

数据手册

74F 16-DIP (0.300", 7.62mm) Tube Obsolete Binary Full Adder 4.5V ~ 5.5V 4 0°C ~ 70°C - - Through Hole 16-PDIP
SN74SSTUB32864NMJR

SN74SSTUB32864NMJR

IC CONFIG REG BUFF 25BIT 96-BGA

Texas Instruments

2,751 6.34
SN74SSTUB32864NMJR

数据手册

74SSTUB 96-LFBGA Tape & Reel (TR) Active Configurable Registered Buffer 1.7V ~ 1.9V 25, 14 -40°C ~ 85°C - - Surface Mount 96-NFBGA (13.5x5.5)
SY58600UMI TR

SY58600UMI TR

IC LINEDRIVER/RCVR CML DIFF 8MLF

Microchip Technology

2,740 -
SY58600UMI TR

数据手册

SY58 8-VFDFN Exposed Pad, 8-MLF® Tape & Reel (TR) Obsolete Differential Receiver/Driver 3V ~ 3.6V - -40°C ~ 85°C - - Surface Mount 8-MLF® (2x2)
SN74ABT8646DLR

SN74ABT8646DLR

IC SCAN TEST DEVICE 28-SSOP

Texas Instruments

4,444 6.75
SN74ABT8646DLR

数据手册

74ABT 28-BSSOP (0.295", 7.50mm Width) Tape & Reel (TR) Active Scan Test Device with Bus Transceiver and Registers 4.5V ~ 5.5V 8 -40°C ~ 85°C - - Surface Mount 28-BSSOP
LM9779CCVS/NOPB

LM9779CCVS/NOPB

IC DATA CONVERSION

Texas Instruments

1,001 7.36

-

* - Tray Active - - - - - - - -
74F181PC

74F181PC

IC ARITHMETIC LOGIC 4BIT 24-DIP

onsemi

2,674 0.80
74F181PC

数据手册

74F 24-DIP (0.600", 15.24mm) Tube Obsolete Arithmetic Logic Unit 4.5V ~ 5.5V 4 0°C ~ 70°C - - Through Hole 24-PDIP
74F181SPC

74F181SPC

IC ARITHMETIC LOGIC 4BIT 24-DIP

onsemi

1,369 5.34
74F181SPC

数据手册

74F 24-DIP (0.300", 7.62mm) Tube Obsolete Arithmetic Logic Unit 4.5V ~ 5.5V 4 0°C ~ 70°C - - Through Hole 24-PDIP
SN74BCT8374ANTG4

SN74BCT8374ANTG4

IC SCAN TEST DEVICE W/FF 24-DIP

Texas Instruments

1,820 -
SN74BCT8374ANTG4

数据手册

74BCT 24-DIP (0.300", 7.62mm) Tube Obsolete Scan Test Device with D-Type Edge-Triggered Flip-Flops 4.5V ~ 5.5V 8 0°C ~ 70°C - - Through Hole 24-PDIP
SN74SSQEB32882ZALR

SN74SSQEB32882ZALR

IC REGSTR BUFFER 28-56BIT 176BGA

Texas Instruments

3,997 4.39
SN74SSQEB32882ZALR

数据手册

74SSQEB 176-TFBGA Tape & Reel (TR) Active 1:2 Registered Buffer with Parity 1.25V, 1.35V, 1.5V 28, 56 - - - Surface Mount 176-NFBGA (13.5x8)
SN74LVT8980ADWRG4

SN74LVT8980ADWRG4

IC TEST-BUS CONTROLLER 24-SOIC

Texas Instruments

1,524 -
SN74LVT8980ADWRG4

数据手册

74LVT 24-SOIC (0.295", 7.50mm Width) Tape & Reel (TR) Discontinued at Digi-Key Embedded Test-Bus Controllers 2.7V ~ 3.6V 8 -40°C ~ 85°C - - Surface Mount 24-SOIC