图片 | 制造商型号 | 库存情况 | 价格 | 库存 | 数据手册 | 系列 | 封装/外壳 | 包装 | 产品状态 | 逻辑类型 | 电源电压 | 位数 | 工作温度 | 等级 | 认证 | 安装类型 | 供应商设备封装 |
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SN74BCT8374ADWRIC SCAN TEST DEVICE W/FF 24-SOIC |
1,862 | - |
|
![]() 数据手册 |
74BCT | 24-SOIC (0.295", 7.50mm Width) | Tape & Reel (TR) | Obsolete | Scan Test Device with D-Type Edge-Triggered Flip-Flops | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | - | - | Surface Mount | 24-SOIC |
|
SN74BCT8240ADWRG4IC SCAN TEST DEVICE 24SOIC |
2,467 | - |
|
![]() 数据手册 |
74BCT | 24-SOIC (0.295", 7.50mm Width) | Tape & Reel (TR) | Obsolete | Scan Test Device with Inverting Buffers | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | - | - | Surface Mount | 24-SOIC |
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SN74BCT8373ADWRG4IC SCAN TEST DEVICE 24SOIC |
1,749 | - |
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![]() 数据手册 |
74BCT | 24-SOIC (0.295", 7.50mm Width) | Tape & Reel (TR) | Obsolete | Scan Test Device with D-Type Latches | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | - | - | Surface Mount | 24-SOIC |
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SN74BCT8374ADWRG4IC SCAN TEST DEVICE 24SOIC |
4,346 | - |
|
![]() 数据手册 |
74BCT | 24-SOIC (0.295", 7.50mm Width) | Tape & Reel (TR) | Obsolete | Scan Test Device with D-Type Edge-Triggered Flip-Flops | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | - | - | Surface Mount | 24-SOIC |
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SN74ABT8543DWRIC SCAN TEST DEVICE 28-SOIC |
3,484 | - |
|
![]() 数据手册 |
74ABT | 28-SOIC (0.295", 7.50mm Width) | Tape & Reel (TR) | Obsolete | Scan Test Device with Registered Bus Transceiver | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | - | - | Surface Mount | 28-SOIC |
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SN74ABT8646DWRIC SCAN TEST DEVICE 28-SOIC |
3,382 | - |
|
![]() 数据手册 |
74ABT | 28-SOIC (0.295", 7.50mm Width) | Tape & Reel (TR) | Obsolete | Scan Test Device with Bus Transceiver and Registers | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | - | - | Surface Mount | 28-SOIC |
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SN74ABT8652DLRIC SCAN TEST DEVICE 28-SSOP |
1,459 | - |
|
![]() 数据手册 |
74ABT | 28-BSSOP (0.295", 7.50mm Width) | Tape & Reel (TR) | Obsolete | Scan Test Device with Bus Transceiver and Registers | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | - | - | Surface Mount | 28-BSSOP |
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SN74ABT8543DWRG4IC SCAN TEST DEVICE 28SOIC |
4,151 | - |
|
![]() 数据手册 |
74ABT | 28-SOIC (0.295", 7.50mm Width) | Tape & Reel (TR) | Obsolete | Scan Test Device with Registered Bus Transceiver | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | - | - | Surface Mount | 28-SOIC |
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SN74ABT8646DWRG4IC SCAN TEST DEVICE 28SOIC |
3,376 | - |
|
![]() 数据手册 |
74ABT | 28-SOIC (0.295", 7.50mm Width) | Tape & Reel (TR) | Obsolete | Scan Test Device with Bus Transceiver and Registers | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | - | - | Surface Mount | 28-SOIC |
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SN74ABT8652DWRG4IC SCAN TEST DEVICE 28SOIC |
3,426 | - |
|
![]() 数据手册 |
74ABT | 28-SOIC (0.295", 7.50mm Width) | Tape & Reel (TR) | Obsolete | Scan Test Device with Bus Transceiver and Registers | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | - | - | Surface Mount | 28-SOIC |
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74F583PCIC ADDER BCD 4BIT 16-DIP |
2,006 | 4.56 |
|
![]() 数据手册 |
74F | 16-DIP (0.300", 7.62mm) | Tube | Obsolete | Binary Full Adder | 4.5V ~ 5.5V | 4 | 0°C ~ 70°C | - | - | Through Hole | 16-PDIP |
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SN74SSTUB32864NMJRIC CONFIG REG BUFF 25BIT 96-BGA |
2,751 | 6.34 |
|
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74SSTUB | 96-LFBGA | Tape & Reel (TR) | Active | Configurable Registered Buffer | 1.7V ~ 1.9V | 25, 14 | -40°C ~ 85°C | - | - | Surface Mount | 96-NFBGA (13.5x5.5) |
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SY58600UMI TRIC LINEDRIVER/RCVR CML DIFF 8MLF |
2,740 | - |
|
![]() 数据手册 |
SY58 | 8-VFDFN Exposed Pad, 8-MLF® | Tape & Reel (TR) | Obsolete | Differential Receiver/Driver | 3V ~ 3.6V | - | -40°C ~ 85°C | - | - | Surface Mount | 8-MLF® (2x2) |
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SN74ABT8646DLRIC SCAN TEST DEVICE 28-SSOP |
4,444 | 6.75 |
|
![]() 数据手册 |
74ABT | 28-BSSOP (0.295", 7.50mm Width) | Tape & Reel (TR) | Active | Scan Test Device with Bus Transceiver and Registers | 4.5V ~ 5.5V | 8 | -40°C ~ 85°C | - | - | Surface Mount | 28-BSSOP |
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LM9779CCVS/NOPBIC DATA CONVERSION |
1,001 | 7.36 |
|
- |
* | - | Tray | Active | - | - | - | - | - | - | - | - |
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74F181PCIC ARITHMETIC LOGIC 4BIT 24-DIP |
2,674 | 0.80 |
|
![]() 数据手册 |
74F | 24-DIP (0.600", 15.24mm) | Tube | Obsolete | Arithmetic Logic Unit | 4.5V ~ 5.5V | 4 | 0°C ~ 70°C | - | - | Through Hole | 24-PDIP |
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74F181SPCIC ARITHMETIC LOGIC 4BIT 24-DIP |
1,369 | 5.34 |
|
![]() 数据手册 |
74F | 24-DIP (0.300", 7.62mm) | Tube | Obsolete | Arithmetic Logic Unit | 4.5V ~ 5.5V | 4 | 0°C ~ 70°C | - | - | Through Hole | 24-PDIP |
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SN74BCT8374ANTG4IC SCAN TEST DEVICE W/FF 24-DIP |
1,820 | - |
|
![]() 数据手册 |
74BCT | 24-DIP (0.300", 7.62mm) | Tube | Obsolete | Scan Test Device with D-Type Edge-Triggered Flip-Flops | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | - | - | Through Hole | 24-PDIP |
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SN74SSQEB32882ZALRIC REGSTR BUFFER 28-56BIT 176BGA |
3,997 | 4.39 |
|
![]() 数据手册 |
74SSQEB | 176-TFBGA | Tape & Reel (TR) | Active | 1:2 Registered Buffer with Parity | 1.25V, 1.35V, 1.5V | 28, 56 | - | - | - | Surface Mount | 176-NFBGA (13.5x8) |
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SN74LVT8980ADWRG4IC TEST-BUS CONTROLLER 24-SOIC |
1,524 | - |
|
![]() 数据手册 |
74LVT | 24-SOIC (0.295", 7.50mm Width) | Tape & Reel (TR) | Discontinued at Digi-Key | Embedded Test-Bus Controllers | 2.7V ~ 3.6V | 8 | -40°C ~ 85°C | - | - | Surface Mount | 24-SOIC |