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图片 制造商型号 库存情况 价格 库存 数据手册 系列 封装/外壳 包装 产品状态 逻辑类型 电源电压 位数 工作温度 等级 认证 安装类型 供应商设备封装
SN74F1016DWR

SN74F1016DWR

IC DIODE ARRAY RC TERM 20-SOIC

Texas Instruments

4,460 2.58
SN74F1016DWR

数据手册

74F 20-SOIC (0.295", 7.50mm Width) Tape & Reel (TR) Active Schottky Barrier Diode Bus-Termination Array - 16 0°C ~ 70°C - - Surface Mount 20-SOIC
SN74BCT8244ADWR

SN74BCT8244ADWR

IC SCAN TEST DEVICE BUFF 24-SOIC

Texas Instruments

4,909 3.94
SN74BCT8244ADWR

数据手册

74BCT 24-SOIC (0.295", 7.50mm Width) Tape & Reel (TR) Discontinued at Digi-Key Scan Test Device with Buffers 4.5V ~ 5.5V 8 0°C ~ 70°C - - Surface Mount 24-SOIC
SN74AS882ADWR

SN74AS882ADWR

LOOK-AHEAD CARRY GENERATOR

Texas Instruments

1,969 3.94
SN74AS882ADWR

数据手册

* - Bulk Active - - - - - - - -
SN74BCT2414DW

SN74BCT2414DW

IC MEMORY DECODER 20-SOIC

Texas Instruments

111 5.02
SN74BCT2414DW

数据手册

74BCT 20-SOIC (0.295", 7.50mm Width) Bulk Active Memory Decoder 4.5V ~ 5.5V - 0°C ~ 75°C - - Surface Mount 20-SOIC
SN74S283N

SN74S283N

IC 4BIT BINARY FULL ADDER 16-DIP

Texas Instruments

3,172 4.11
SN74S283N

数据手册

74S 16-DIP (0.300", 7.62mm) Bulk Active Binary Full Adder with Fast Carry 4.75V ~ 5.25V 4 0°C ~ 70°C - - Through Hole 16-PDIP
SN74LS381AN

SN74LS381AN

ALU, LS SERIES

Texas Instruments

356 4.27
SN74LS381AN

数据手册

* - Bulk Active - - - - - - - -
SN74SSTVF16857GR

SN74SSTVF16857GR

IC REG BUFF 14BIT SSTL 48-TSSOP

Texas Instruments

1,362 2.89
SN74SSTVF16857GR

数据手册

74SSTVF 48-TFSOP (0.240", 6.10mm Width) Tape & Reel (TR) Active Registered Buffer with SSTL_2 Compatible I/O for DDR 2.3V ~ 2.7V 14 0°C ~ 70°C - - Surface Mount 48-TSSOP
SN74ABT8952DWR

SN74ABT8952DWR

IC SCAN TEST DEVICE 28SOIC

Texas Instruments

4,047 4.40
SN74ABT8952DWR

数据手册

74ABT 28-SOIC (0.295", 7.50mm Width) Tape & Reel (TR) Obsolete Scan Test Device with Registered Bus Transceiver 4.5V ~ 5.5V 8 -40°C ~ 85°C - - Surface Mount 28-SOIC
SN74BCT8244ANT

SN74BCT8244ANT

IC SCAN TEST DEVICE BUFF 24-DIP

Texas Instruments

1,261 4.44
SN74BCT8244ANT

数据手册

74BCT 24-DIP (0.300", 7.62mm) Tube Obsolete Scan Test Device with Buffers 4.5V ~ 5.5V 8 0°C ~ 70°C - - Through Hole 24-PDIP
SN74BCT8373ANT

SN74BCT8373ANT

IC SCAN TEST DEVICE LATCH 24-DIP

Texas Instruments

1,164 4.44
SN74BCT8373ANT

数据手册

74BCT 24-DIP (0.300", 7.62mm) Tube Obsolete Scan Test Device with D-Type Latches 4.5V ~ 5.5V 8 0°C ~ 70°C - - Through Hole 24-PDIP