产品中心

制造商 系列 封装/外壳 包装 产品状态 逻辑类型 电源电压 位数 工作温度 等级 认证 安装类型 供应商设备封装


















































































































































































































































































































































































































































































































































全部重置
应用所有
结果:
图片 制造商型号 库存情况 价格 库存 数据手册 系列 封装/外壳 包装 产品状态 逻辑类型 电源电压 位数 工作温度 等级 认证 安装类型 供应商设备封装
SN74ABT8952DW

SN74ABT8952DW

IC SCAN-TEST-DEV/XCVR 28-SOIC

Texas Instruments

3,550 5.30
SN74ABT8952DW

数据手册

74ABT 28-SOIC (0.295", 7.50mm Width) Tube Obsolete Scan Test Device with Registered Bus Transceiver 4.5V ~ 5.5V 8 -40°C ~ 85°C - - Surface Mount 28-SOIC
SNJ54AS181BJT

SNJ54AS181BJT

ARITHMETIC LOGIC UNIT

Texas Instruments

104 5.37
SNJ54AS181BJT

数据手册

* - Bulk Active - - - - - - - -
SN74BCT8240ADWR

SN74BCT8240ADWR

IC SCAN TEST DEVICE BUFF 24-SOIC

Texas Instruments

4,522 5.48
SN74BCT8240ADWR

数据手册

74BCT 24-SOIC (0.295", 7.50mm Width) Tape & Reel (TR) Obsolete Scan Test Device with Inverting Buffers 4.5V ~ 5.5V 8 0°C ~ 70°C - - Surface Mount 24-SOIC
SN74BCT8240ANT

SN74BCT8240ANT

IC SCAN TEST DEVICE BUFF 24-DIP

Texas Instruments

2,747 5.48
SN74BCT8240ANT

数据手册

74BCT 24-DIP (0.300", 7.62mm) Tube Obsolete Scan Test Device with Inverting Buffers 4.5V ~ 5.5V 8 0°C ~ 70°C - - Through Hole 24-PDIP
SN74SSTVF16859GR

SN74SSTVF16859GR

IC REG BUFFER 13-26BIT 64-TSSOP

Texas Instruments

3,170 3.78
SN74SSTVF16859GR

数据手册

74SSTVF 64-TFSOP (0.240", 6.10mm Width) Tape & Reel (TR) Active Registered Buffer with SSTL_2 Compatible I/O for DDR 2.3V ~ 2.7V 13, 26 0°C ~ 70°C - - Surface Mount 64-TSSOP
SN74SSTV16859DGGR

SN74SSTV16859DGGR

IC REG BUFFER 13-26BIT 64-TSSOP

Texas Instruments

2,608 3.78
SN74SSTV16859DGGR

数据手册

74SSTV 64-TFSOP (0.240", 6.10mm Width) Tape & Reel (TR) Active Registered Buffer with SSTL_2 Compatible I/O for DDR 2.3V ~ 2.7V 13, 26 0°C ~ 70°C - - Surface Mount 64-TSSOP
SN74BCT8374ANT

SN74BCT8374ANT

IC SCAN TEST DEVICE W/FF 24-DIP

Texas Instruments

2,530 3.30
SN74BCT8374ANT

数据手册

74BCT 24-DIP (0.300", 7.62mm) Tube Obsolete Scan Test Device with D-Type Edge-Triggered Flip-Flops 4.5V ~ 5.5V 8 0°C ~ 70°C - - Through Hole 24-PDIP
SN74ABT8646DW

SN74ABT8646DW

IC SCAN-TEST-DEV/XCVR 28-SOIC

Texas Instruments

3,830 6.25
SN74ABT8646DW

数据手册

74ABT 28-SOIC (0.295", 7.50mm Width) Bulk Active Scan Test Device with Bus Transceiver and Registers 4.5V ~ 5.5V 8 -40°C ~ 85°C - - Surface Mount 28-SOIC
SN74SSQE32882ZALR

SN74SSQE32882ZALR

IC REGISTERING CLOCK DVR 176-BGA

Texas Instruments

2,557 3.91
SN74SSQE32882ZALR

数据手册

- 176-TFBGA Tape & Reel (TR) Not For New Designs 1:2 Registered Buffer with Parity 1.425V ~ 1.575V 28, 56 0°C ~ 85°C - - Surface Mount 176-NFBGA (13.5x8)
SN74SSTL16857DGGR

SN74SSTL16857DGGR

IC REG BUFFER 14-BIT 48-TSSOP

Texas Instruments

6,000 5.73
SN74SSTL16857DGGR

数据手册

74SSTL 48-TFSOP (0.240", 6.10mm Width) Bulk Obsolete Registered Buffer with SSTL_2 Compatible I/O for DDR 2.3V ~ 2.7V 14 0°C ~ 70°C - - Surface Mount 48-TSSOP